BS-EN-60749-39 › Historical Revision Information
Semiconductor Devices, Mechanical & Climatic Test Methods, Measurement of Moisture Dif
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Semiconductor devices. Mechanical and climatic test methods
Keywords
Solubility;Environmental testing;Diffusion;Moisture measurement;Water;Moisture control;Mechanical testing;Electronic equipment and components;Semiconductor devices
To find similar documents by classification:
31.080.01 (Semiconductor devices in general)
Document Number
BS EN 60749-39:2006
Revision Level
2006 EDITION
Status
Superseded
Publication Date
Dec. 29, 2006
Replaces Notes
BS EN 60749:1999
Replaced By
BS EN IEC 60749-39:2022
Page Count
12
ISBN
0580498662
International Equivalent
IEC 60749-39:2006;EN 60749-39:2006
Committee Number
EPL/47