IEC-60749-43 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

IEC-60749-43 - EDITION 1.0 - SUPERSEDED -- See the following: IEC-63287-1
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IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

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31.080.01 (Semiconductor devices in general)

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Document Number

IEC 60749-43 Ed. 1.0 b:2017

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Publication Date

June 1, 2017

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