ASTM-F1262M › Complete Document History
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)


Obsolete Revision Information:
   WITHDARWN - WITHDRAWN WITHOUT SUPERCEDING - Jan. 11, 2023
   2014 EDITION - Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) - July 15, 2014
   1995 R08 EDITION - REAPPROVED IN 2008 - July 1, 2008
   1995 R02 EDITION - REAPPROVED IN 2002 - Dec. 10, 2002
   1995 EDITION - Transient Radiation Upset Threshold Testing of Digital Integ - Nov. 10, 1995