ASTM-F1262M › Historical Revision Information
Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Withdrawn 2023)

ASTM-F1262M - WITHDARWN - CANCELLED
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Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric) (Withdrawn 2023)
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Scope

1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s.

1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Keywords

digital integrated circuits; digital IC's; functional errors; ionizing; pulsed radiation; radiation; transient radiation; upset threshold

To find similar documents by ASTM Volume:

10.04 (Electronics; Declarable Substances in Materials; 3D Imaging Systems)

To find similar documents by classification:

31.200 (Integrated circuits. Microelectronics Including electronic chips, logical and analogue microstructures Microprocessors, see 35.160)

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Document Number

ASTM-F1262M

Revision Level

WITHDARWN

Status

Cancelled

Modification Type

Revision with Designation Change

Publication Date

Jan. 11, 2023

Document Type

Guide

Committee Number

F01.11