ASTM-F1262M › Historical Revision Information
Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
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Scope
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Significance and Use
Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.
Keywords
digital integrated circuits; digital IC's; functional errors; ionizing; pulsed radiation; radiation; transient radiation; upset threshold; ICS Number Code 31.200 (Integrated circuits. Microelectronics)
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Document Number
ASTM-F1262M-95(2002)
Revision Level
1995 R02 EDITION
Status
Superseded
Modification Type
Reapproval
Publication Date
Dec. 10, 2002
Document Type
Guide
Page Count
5 pages
Committee Number
F01.11